Semiconductor Component and an Operating Method for a Protective Circuit Against Light Attacks

ABSTRACT

A semiconductor component includes a semiconductor substrate, and a doped well having a well terminal and a transistor structure having at least one potential terminal formed in the semiconductor substrate. The transistor structure has a parasitic thyristor, and is at least partly arranged in the doped well. The potential terminal and the well terminal are connected via a resistor.

PRIORITY CLAIM

This application is a continuation of U.S. patent application Ser. No.13/450,907 filed on 19 Apr. 2012, which in turn claims priority toGerman Patent Application No. 10 2011 018 450.3 filed on 21 Apr. 2011,the content of both of said applications incorporated herein byreference in their entirety.

TECHNICAL FIELD

The present invention relates to a semiconductor component and anoperating method for a protective circuit against light attacks.

BACKGROUND

Semiconductor components comprising a logic circuit, such as are used ina CPU, for example, are often constructed with CMOS (complementary metaloxide semiconductor) gates. CMOS gates contain p-channel transistorsarranged in an n-conductively doped well. The n-type wells are fixedlyconnected to the highest electrical potential provided (supply voltageV_(DD)). The pn junction between the n-conductively doped well and thesource-drain regions becomes non-conducting. Defined transistorproperties are obtained as a result. Moreover, this arrangement preventsthe well potential from falling below a value at which a so-calledlatch-up occurs that is to say a transition of the semiconductorcomponent to a low-impedance state that can lead to an electrical shortcircuit and thus to thermal destruction of the component.

One problem in the case of semiconductor components forsecurity-critical applications is also required safeguarding againstlight attacks by which functional disturbances of the component can bebrought about or an undesirable external analysis of the circuitconstruction is intended to be made possible. There are already a numberof proposals as to how a semiconductor component can be protectedagainst light attacks.

In the case of light attacks, a distinction is made between global lightattacks and local light attacks. In the case of global light attacks,the chip is exposed to light or ionizing radiation over a large area.This attack is not restricted to delimited regions. It is known thatglobal light attacks can be detected by light sensors arranged in ascattered manner on the chip.

Local light attacks are locally highly delimited attacks on asemiconductor component and can be carried out by means of a laser, forexample. By means of local light attacks, it is possible to changeindividual bits in sensitive regions. They generally require the chiphousing to be opened and the circuit structure to be exposed. Locallight attacks can be detected by means of a dual CPU (central processingunit) arrangement, for example.

US 2011/0043245 A1 discloses a semiconductor component including aparasitic activation structure for protection against light attacks,wherein the energy limit value for activating the parasitic structure islower than the energy limit value for changing the status of a storageflip-flop of the semiconductor component. In this case, a currentlimiting circuit limits the current flowing in the semiconductorcomponent.

The known measures are not only very complex and make the componentconsiderably more expensive, but, as in the case of the dual CPUarrangement, may also result in an increase in the currentconsumption/demand and the area requirement. The additional arearequirement of the components of a protective circuit readily exceedsthe area available for the entire integrated circuit.

SUMMARY

Therefore, it is an object of the present invention to provide asemiconductor component having a cost-effective construction andimproved protective properties against local light attacks.

The semiconductor component according to the invention comprises asemiconductor substrate, wherein a doped well having a well terminal anda transistor structure having at least one potential terminal are formedin the semiconductor substrate. A supply potential, for example V_(DD),can be present at the potential terminal. The transistor structure has aparasitic thyristor, which is partly arranged in the doped well, whereinthe potential terminal and the well terminal are connected via aresistor.

According to the invention, unlike what is customary in the prior art,the well is not fixedly connected to the highest electrical potential,rather a resistor is arranged between the well terminal and thepotential terminal. As a result of this arrangement, the highestelectrical potential, for example the positive supply voltage V_(DD),can be present at the potential terminal, while, in the case of a lightattack, a lower potential, reduced by the voltage drop across theresistor, is present at the well terminal.

Instead of the positive supply voltage V_(DD) a negative supply voltageV_(SS) can also be present at the potential terminal.

The sensitivity of the parasitic thyristor towards a light attack can beadjusted by means of the value of the resistor. The parasitic thyristorcan be adjusted such that it triggers under specific conditions and thusinitiates a latch-up or a latch-up preliminary stage. As a result of thehigh currents which flow in the case of a latch-up or a latch-uppreliminary stage, data stored on the semiconductor component can bedestroyed or erased. Furthermore, the function of the semiconductorcomponent can be destroyed or the semiconductor component can bethermally damaged or destroyed.

The resistor can be embodied in such a way that a light attack triggersthe parasitic thyristor before a functional disturbance for externalanalysis of the circuit construction or for reading out data stored onthe semiconductor component is possible. The resistor advantageously hasa value of between 50 and 500 ohms.

The resistor can be an adjustable resistor, wherein the resistor can beadjusted after the end of the manufacturing process. The sensitivity ofthe parasitic thyristor to light attacks can be changed by theadjustment of the resistor.

The resistor can be a polysilicon resistor or a metal resistor, whichcan be arranged outside the semiconductor substrate.

In a further exemplary embodiment, the resistor is formed in thesemiconductor substrate, for example in a doped well and/or in adiffusion region.

The resistor can also be a regulable resistor, wherein the semiconductorcomponent is embodied such that the resistor can be regulated in amanner dependent on a physical variable measured in the semiconductorcomponent. By way of example, temperature and/or other ambientconditions and/or an ageing-dictated change of the semiconductorcomponent can be taken into account by means of a regulable resistor.

The semiconductor component can furthermore comprise a temperaturesensor, wherein the semiconductor component is embodied such that it canregulate the resistor in a manner dependent on a temperature measured bythe temperature sensor.

The semiconductor component can be a semiconductor component constructedusing CMOS technology. The semiconductor component can also comprise aplurality of transistor structures each having a parasitic thyristor.

In a further exemplary embodiment, the resistor can be connected to thepotential terminals of a plurality of transistor structures. In thiscase, the transistor structures can be a part or the totality of a logiccircuit constructed generally with CMOS transistors.

In one exemplary embodiment, the doped well is an n-type well and theelectrical potential present at the potential terminal is a positivesupply voltage V_(DD), wherein the potential terminal and the wellterminal are connected via the resistor, which can be arranged outsidethe doped well. However, the doped well can also be a p-type well andthe electrical potential present at the potential terminal can be anegative supply voltage V_(SS).

Furthermore, the semiconductor component can comprise a current limitingcircuit, wherein the current limiting circuit can be designed such thatthe semiconductor component is not damaged when the parasitic thyristoris triggered. Even though the semiconductor component is not damaged bythe current limiting, the function of the semiconductor component can bedisturbed in such a way that it is no longer possible to read out datastored on the semiconductor component and/or to conduct an externalanalysis of the circuit construction.

Furthermore, the semiconductor component can comprise an alarm circuit,wherein the alarm circuit is designed such that a function of thesemiconductor component is blocked at least temporarily when theparasitic thyristor is triggered. The semiconductor component can beblocked such that an undesirable external analysis of the semiconductorcomponent or the data content thereof is prevented. Such function can beenabled by a reset, for example.

The semiconductor component according to the invention achievesarea-covering protection against light attacks both from the front sideand from the rear side (substrate) of the semiconductor component. Nofurther measures are required within the circuit to be protected. Theentire circuit integrated into the chip, in particular a complete logiccircuit, can be protected. The sensitivity can be preset by the choiceof the resistor or by the layer construction of the semiconductorcomponent.

The arrangement of the resistor between the potential terminal and thewell terminal and utilization of the latch-up effect make it possible toeffectively protect the semiconductor component against light andradiation attacks, virtually without increasing the overall arearequirement. Moreover, the arrangement of the resistor between the wellterminal and the potential terminal, in contrast to other, knownsolutions against light attacks, consumes no additional current. Eventhe subsequent implementation of such a resistor into existing logiccircuits, designs and IP blocks is possible without high outlay.

An operating method for a protective circuit and a semiconductorcomponent enables the semiconductor component to be effectivelyprotected against light attacks. In this case, the semiconductorcomponent comprises a semiconductor substrate having a doped well havinga well terminal and a transistor structure arranged at least partly inthe well and having at least one potential terminal and having aparasitic thyristor, wherein the potential terminal and the wellterminal are connected by a resistor. Upon exposure to light orradiation, the parasitic thyristor turns on, as a result of which it isno longer possible to read out data stored on the semiconductorcomponent, or the semiconductor component is functionally disturbed ordamaged or destroyed.

Those skilled in the art will recognize additional features andadvantages upon reading the following detailed description, and uponviewing the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

Exemplary embodiments of the semiconductor component are described inmore detail below with reference to the accompanying Figures. Thedrawings serve to illustrate the basic principle, so that only aspectsnecessary for understanding the basic principle are illustrated. Thedrawings are not to scale. In the drawings the same reference charactersdenote like features.

FIG. 1 shows an exemplary embodiment of a semiconductor component incross section.

FIG. 2 shows an exemplary embodiment of a logic circuit.

DETAILED DESCRIPTION

FIG. 1 shows an exemplary embodiment of a semiconductor component 100using CMOS technology in cross section. The semiconductor component 100comprises an n-channel field effect transistor 34 and a p-channel fieldeffect transistor 32. The two field effect transistors 32, 34 togetherform a transistor structure 30. While the n-channel field effecttransistor 34 is arranged in a p-doped semiconductor substrate 20 of thesemiconductor component 100, the p-channel field effect transistor 32 isarranged in an n-doped well 10 formed in the semiconductor substrate 20.The n-doped well 10 has a well terminal 5 with an n⁺-doped diffusionregion. The p-channel field effect transistor 32 has a potentialterminal 35. A supply voltage V_(DD) is present at the potentialterminal 35. The supply voltage V_(DD) of a semiconductor component 100can be approximately 1.5 V.

The layer construction of the individual dopings of the transistorstructure 30 results in a parasitic npn bipolar transistor 44 and aparasitic pnp bipolar transistor 42. The npn bipolar transistor 44 andthe pnp bipolar transistor 42 correspond to a parasitic thyristor 40 interms of their mutual interconnection.

The parasitic thyristor 40 has a lateral npn bipolar transistor 44 and avertical pnp bipolar transistor 42. The source-drain regions of thep-channel field effect transistor 32 are the emitter and the n-dopedwell 10 is the base of the resultant pnp bipolar transistor 42, whilethe p-doped semiconductor substrate 20 constitutes the collector.Correspondingly, the source-drain regions of the n-channel field effecttransistor 34, the p-doped semiconductor substrate 20 and the n-dopedwell 10 form the emitter, base and collector of the npn bipolartransistor 44. The potential terminal 35 and the well terminal 5 areconnected to one another via a resistor R. The resistor R, asillustrated schematically in this exemplary embodiment is arrangedoutside the semiconductor substrate 20 or outside the doped well 10. Thesensitivity of the parasitic thyristor 40 towards a light attack can beadjusted by the value of the resistor R. The parasitic thyristor 40 canbe adjusted such that it triggers under specific conditions and thusinitiates a latch-up or a latch-up preliminary stage.

The npn bipolar transistor 44 and the pnp bipolar transistor 42 areturned off under normal operating conditions. If, on account of externalconditions, for example as a result of a light attack, a voltage dropoccurs at one of the two base-emitter diodes of one of the two parasiticbipolar transistors 42, 44, then a collector current flows through thisbipolar transistor. This collector current produces a voltage dropacross the complementary bipolar transistor. If, in the latter as well,the base-emitter voltage is exceeded, both bipolar transistors 42, 44are now in the on-state. The consequence is a positive feedback betweenthe two bipolar transistors 42, 44, thus giving rise to a permanentlow-impedance connection between the supply voltage V_(DD) and groundV_(SS). This low-impedance connection can then be disconnected only byremoval of the supply voltage V_(DD).

If the current supply of one of the two parasitic bipolar transistors42, 44 is high enough, then the arrangement remains in an active stateeven after the disappearance of the currents injected, for example by alight attack. This state is called latch-up or latching state. Thelatch-up leads to a malfunction of the semiconductor component 100 sincethe outputs of the field effect transistors 32, 34 are at a fixedpotential and no longer react to changes at the gate terminal. As aresult of the high currents flowing during a latch-up or a latch-uppreliminary stage, data stored on the semiconductor component 100 can beerased or altered. In the case of very high currents, thermaldestruction or melting of the feeding metal tracks or underlyingstructures of the semiconductor component 100 can occur. Even if thesemiconductor component 100 is not damaged by the latch-up or itspreliminary stage, the function of the semiconductor component 100 canbe lastingly disturbed.

FIG. 2 shows a plurality of semiconductor components 100 arranged in theform of a logic circuit 200. In this exemplary embodiment, the resistorR is an adjustable or regulable resistor. The resistor R is arrangedbetween the potential terminals 35 of a plurality of transistorstructures 30-1, 30-2, . . . 30-n and the well terminals 5 of thetransistor structures 30-1, 30-2, ... 30-n. In this case, eachtransistor structure 30-1, 30-2, . . . 30-n has a parasitic thyristor.In this case, the transistor structures 30-1, 30-2, . . . 30-n are partof a synthesized logic/logic circuit.

A positive supply voltage V_(DD) is present at the potential terminals35 and a voltage V_(WELL) is present at the well terminals 5. In thenormal operating state, the voltage V_(WELL) at the well terminals 5 isequal to the positive supply voltage V_(DD). In the case of a lightattack, the supply voltage V_(DD) remains constant, while the voltageV_(WELL) decreases by the voltage drop across the resistor R.

The sensitivity of the parasitic thyristors of the transistor structures30-1, 30-2, . . . 30-n towards a light attack can be adjusted by thevalue of the resistor R. The parasitic thyristors can be adjusted suchthat they trigger under specific conditions and thus initiate a latch-upor a latch-up preliminary stage. As a result of the high currents whichflow during a latch-up or a latch-up preliminary stage, data stored onthe semiconductor components 100 can be destroyed or erased.Furthermore, the function of the semiconductor components 100 can bedisturbed or the semiconductor components 100 can be thermally damagedor destroyed.

The construction of the logic circuit 200 with the semiconductorcomponents 100 according to the invention makes it possible toeffectively protect the entire logic circuit 200 against light orradiation attacks, without additional design measures, sensors or areaexpenditure.

If the resistor R is an adjustable resistor, the resistor R can beadjusted after the end of the manufacturing process. By way of example,the sensitivity of the parasitic thyristors to light attacks can beadjusted by the adjustment of the resistor R.

If the resistor R is a regulable resistor, then the resistor R can beembodied such that the resistor R can be regulated in a manner dependenton a physical variable measured in the semiconductor component 100. Byway of example, temperature and/or other ambient conditions and/or anageing dictated change of the semiconductor component 100 can be takeninto account by a regulable resistor R.

Spatially relative terms such as “under”, “below”, “lower”, “over”,“upper” and the like, are used for ease of description to explain thepositioning of one element relative to a second element. These terms areintended to encompass different orientations of the device in additionto different orientations than those depicted in the figures. Further,terms such as “first”, “second”, and the like, are also used to describevarious elements, regions, sections, etc. and are also not intended tobe limiting. Like terms refer to like elements throughout thedescription.

As used herein, the terms “having”, “containing”, “including”,“comprising” and the like are open ended terms that indicate thepresence of stated elements or features, but do not preclude additionalelements or features. The articles “a”, “an” and “the” are intended toinclude the plural as well as the singular, unless the context clearlyindicates otherwise.

With the above range of variations and applications in mind, it shouldbe understood that the present invention is not limited by the foregoingdescription, nor is it limited by the accompanying drawings. Instead,the present invention is limited only by the following claims and theirlegal equivalents.

1. A semiconductor component, comprising: a semiconductor substrate; adoped well formed in the semiconductor substrate, the doped well havinga well terminal; a transistor structure formed in the semiconductorsubstrate, the transistor structure having a potential terminal and aparasitic thyristor partly arranged in the doped well; and a resistorconnecting the potential terminal and the well terminal, wherein lightattack information is present at the well terminal during a light attackon the semiconductor component, the light attack information indicatingthe degree of the light attack.
 2. A semiconductor component accordingto claim 1, wherein the resistor is operable such that that a lightattack turns on the parasitic thyristor.
 3. A semiconductor componentaccording to claim 1, wherein the resistor is arranged outside the dopedwell.
 4. A semiconductor component according to claim 3, wherein theresistor is a polysilicon resistor or a metal resistor.
 5. Asemiconductor component according to claim 1, wherein the resistor isarranged outside the semiconductor substrate.
 6. A semiconductorcomponent according to claim 5, wherein the resistor is a polysiliconresistor or a metal resistor.
 7. A semiconductor component according toclaim 1, wherein the resistor is formed in the semiconductor substrate,in a doped well and/or in a diffusion region.
 8. A semiconductorcomponent according to claim 1, wherein the resistor is an adjustableresistor and the semiconductor component is operable such that thesensitivity of the parasitic thyristor to light attacks is adjustable byan adjustment of the resistor.
 9. A semiconductor component according toclaim 1, wherein the resistor is a regulable resistor and thesemiconductor component is operable to regulate the resistor based on aphysical variable measured in the semiconductor component.
 10. Asemiconductor component according to claim 9, further comprising atemperature sensor, wherein the semiconductor component is operable toregulate the resistor based on a temperature measured by the temperaturesensor.
 11. A semiconductor component according to claim 1, wherein thesemiconductor component is a CMOS semiconductor component.
 12. Asemiconductor component according to claim 1, wherein the semiconductorcomponent comprises a plurality of transistor structures each having aparasitic thyristor.
 13. A semiconductor component according to claim12, wherein the resistor is connected to the potential terminals of theplurality of transistor structures.
 14. A semiconductor componentaccording to claim 1, wherein the doped well is an n-type well and theelectrical potential present at the potential terminal is a positivesupply voltage.
 15. A semiconductor component according to claim 1,wherein the semiconductor component comprises a logic circuit and thetransistor structure is a part of the logic circuit.
 16. A semiconductorcomponent according to claim 1, further comprising a current limitingcircuit operable to protect the semiconductor component against damagewhen the parasitic thyristor is triggered.
 17. (canceled)
 18. A methodof operating a protective circuit against light attacks in asemiconductor component comprising a semiconductor substrate, a dopedwell having a well terminal and a transistor structure arranged at leastpartly in the well and having at least one potential terminal and havinga parasitic thyristor, the method comprising: connecting the potentialterminal and the well terminal by a resistor; and turning on theparasitic thyristor in a latch-up or latch-up preliminary stage uponexposure to light and disturbing the function of the semiconductorcomponent, wherein light attack information is present at the wellterminal during the light exposure and indicates the degree of the lightexposure.
 19. A method according to claim 18, further comprisingprotecting the semiconductor component against damage when the parasiticthyristor is turned on.
 20. A method according to claim 18, furthercomprising blocking a function of the semiconductor component at leasttemporarily when the parasitic thyristor is turned on.